EVB-USB3250
USB2.0 PHY Evaluation Board
Introduction
The EVB-USB3250 is a card designed to plug into the user's
test system using a standard interface. The board includes
the USB3250 packaged silicon and all associated external components.
The GT3200 is supported by the EVB-USB3250, and all signals have the same functionality in the 64-pin package (GT3200) and the 56-pin package (USB3250). Both packages support the 8-Bit Uni-Directional (60MHz) or the 16-Bit Bi-Directional (30MHz) Parallel Digital Interface, and use the same signal names.
Product Description
The EVB-USB3250 is designed as a Daughter Card with a standard test interface. The test interface is documented in the USB2.0 Transceiver and Macrocell Tester (T&MT) interface specification.
Features
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Interface Compliant with the UTMI Specification |
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Supports 480 Mbps High Speed (HS) and 12
Mbps Full Speed (FS) Serial Data Transmission Rates |
|
Interfaces Through 100-pin Connector as Defined
in the T&MT Interface Specification |
|
Powered by 3.3V from the 100-Pin Connector |
|
Supports Both 8-Bit Uni-Directional (60MHz)
and 16-Bit Bi-Directional (30MHz) Parallel Digital Interface |
|
Supports Tests Modes Per USB2.0 Specification,
Section 7.1.20 |
|
Standard USB Type 'B' Connector |
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Includes Probe Points on All Data and Control
Signals for Troubleshooting |
|
Includes 12MHz Crystal for PHY Reference;
Supplies Clock to the 100-Pin Connector |
Applications
The EVB-USB3250 simplifies the process of testing a Universal
Serial Bus (USB) 2.0 system.
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Verify SIE to PHY interface |
|
Support testing of FPGA implementations of
SIE |
|
Assist interoperability test of various SIEs |
|
Verify UTMI compliance |
EVB-USB3250 Documentation and Support Files
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